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Journal of Applied Physics

Volumn 72, Issue 8, 1992, Pages 3554-3561

Thresholds of impact ionization in semiconductors

(2) Bude, J a Hess, K a

a UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 36449005581 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.351434 Document Type: Article

Times cited : (156)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.