A simple model to determine multiplication and noise in avalanche photodiodes

Journal of Applied Physics

Volumn 83, Issue 6, 1998, Pages 3426-3428

  Ong, D S ^a   Li, K F ^a   Rees, G J ^a   David, J P R ^a   Robson, P N ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001282097     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367111     Document Type: Article

References (7)

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2. D. S. Ong, K. F. Li, G. J. Rees, G. M. Dunn, J. P. R. David, and P. N. Robson, IEEE Trans. Electron. Devices (submitted).
3. C. Hu, K. A. Anselm, B. G. Streetman, and J. C. Campbell, Appl. Phys. Lett. 69, 3734 (1996).
4. K. F. Li, D. S. Ong, J. P. R. David, P. N. Robson, R. C. Tozer, G. J. Rees, and R. Grey, presented in 55th IEEE Device Research Conference, Colorado, USA, 1997.
5. Y. Okuto and C. R. Crowell, Phys. Rev. B 10, 4284 (1974).
6. M. M. Hayat, B. E. A. Saleh, and M. C. Teich, IEEE Trans. Electron Devices 39, 546 (1992).
7. A. Spinelli, A. Pacelli, and A. L. Lacaita, Appl. Phys. Lett. 69, 3707 (1996).