SCOPUS 정보 검색 플랫폼

Thin Solid Films

Volumn 367, Issue 1-2, 2000, Pages 149-158

Imaging wurtzite GaN surfaces by molecular beam epitaxy-scanning tunneling microscopy

(8) Xue, Q K a,e Xue, Q Z a Kuwano, S a Sakurai, T a Ohno, T b Tsong, I S T c Qiu, X G d Segawa, Y d

a TOHOKU UNIVERSITY (Japan)

b NATIONAL INSTITUTE FOR MATERIALS SCIENCE (Japan)

c ARIZONA STATE UNIVERSITY (United States)

d INST OF PHYS AND CHEMICAL RESEARCH (Japan)

e INSTITUTE OF PHYSICS (China)

Author keywords

First principles total energy calculations; Scanning tunneling microscopy; Wurtzite GaN

Indexed keywords

EID: 0000068847 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/S0040-6090(00)00669-6 Document Type: Article

Times cited : (14)

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