Field-ion scanning tunneling microscopy study of the atomic structure of 6H-SiC(0001) surfaces cleaned by in situ Si molecular beam etching

Journal of Applied Physics

Volumn 80, Issue 4, 1996, Pages 2524-2526

  Li, L ^a   Hasegawa, Y ^a   Sakurai, T ^a   Tsong, I S T ^b  

^a TOHOKU UNIVERSITY   (Japan)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001073246     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.363037     Document Type: Article

References (15)

1. H. S. Kong, J. T. Glass, and R. F. Davis, J. Appl. Phys. 64, 2672 (1988).
2. H. Matsunami, T. Ueda, and H. Nishino, Mater. Res. Soc. Symp. Proc. 162, 397 (1990).
3. T. Kimoto, A. Yamashita, A. Itoh, and H. Matsunami, Jpn. J. Appl. Phys. 32, 1045 (1993).
4. T. Kimoto, H. Nishino, W. S. Yoo, and H. Matsunami, J. Appl. Phys. 73, 726 (1993).
5. A. Yamashita, W. S. Yoo, T. Kimoto, and H. Matsunami, Jpn. J. Appl. Phys. 31, 3655 (1992).
6. S. Tanaka, R. S. Scott, and R. F. Davis, Appl. Phys. Lett. 65, 2851 (1994).
7. A. Fissel, U. Kasier, E. Ducke, B. Schroter, and W. Richter, J. Cryst. Growth 154, 72 (1995).
8. S. Nakanishi, H. Tokutaka, K. Nishimori, S. Kishida, and N. Ishihara, Appl. Surf. Sci. 41/42, 44 (1989).
9. F. Owman and P. Martensson, Surf. Sci. 330, L639 (1995).
10. R. Kaplan, Surf. Sci. 215, 111 (1989).
11. L. Li and I. S. T. Tsong, Surf. Sci. 351, 141 (1996).
12. T. Sakurai, T. Hashizume, I. Kamiyu, Y. Hasegawa, N. Sano, H. W. Pickering, and A. Sakai, Prog. Surf. Sci. 33, 3 (1990).
13. M. Tabe, Jpn. J. Appl. Phys. 21, 534 (1982).
14. L. Muehlhoff, W. J. Choyke, M. J. Bozack, and John T. Yates, Jr., J. Appl. Phys. 60, 2842 (1986).
15. T. Fuyuki, T. Yoshinobu, and H. Matsunami, Thin Solid Films 225, 225 (1993).