Polarity determination of GaN films by ion channeling and convergent beam electron diffraction

Applied Physics Letters

Volumn 69, Issue 17, 1996, Pages 2480-2482

  Daudin, B ^a   Rouviere J L ^a   Arlery, M ^a  

^a CEA GRENOBLE   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001243705     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.117504     Document Type: Article

References (10)

1. S. Nakamura, Proceedings of the International Symposium on Blue Lasers and Light Emitting Diodes, Chiba, March 1996.
2. J. L. Rouvière, M. Arlery, A. Bourret, R. Niebuhr, K. H. Bachem, Proceedings of the MRS meeting, Boston, November 1995
3. A. C. Chami, E. Ligeon, R. Danielou, and J. Fontenille, Appl. Phys. Lett. 52, 1502 (1988)
4. See, for instance, J. C. H. Spence and J. M. Zuo, Electron Microdiffraction (Plenum, New York, 1992).
5. R. Niebuhr, K. Bachem, K. Dombrowski, M. Maier, W. Pletschen, and U. Kaufmann (unpublished).
6. J. H. Barrett, Phys. Rev. B 20, 3535 (1979)
7. D. V. Morgan, Channeling (Wiley, London, 1973), p. 56.
8. P. A. Stadelmann, Ultramicroscopy 21, 131 (1987)
9. J L. Rouvière and M. Arlery (unpublished).
10. B. Daudin, J. L. Rouvière, E. Ligeon, M. Arlery, R. Niebuhr, and K. H. Bachem, Proceedings of the International Symposium on Blue Lasers and Light Emitting Diodes, Chiba, March 1996.