Reflection high-energy electron diffraction studies of wurtzite GaN grown by molecular beam epitaxy

Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures

Volumn 16, Issue 4, 1998, Pages 2237-2241

  Hughes, O H ^a   Korakakis, D ^a   Cheng, T S ^a   Blant, A V ^a   Jeffs, N J ^a   Foxon, C T ^a  

^a UNIVERSITY OF NOTTINGHAM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000261597     PISSN: 10711023     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.590155     Document Type: Article

References (12)

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