Excluding Contact Electrification in Surface Potential Measurement Using Kelvin Probe Force Microscopy

ACS Nano

Volumn 10, Issue 2, 2016, Pages 2528-2535

  Li, Shengming ^a,b   Zhou, Yusheng ^a   Zi, Yunlong ^a   Zhang, Gong ^b   Wang, Zhong Lin ^a,c  

^a Georgia Institute of Technology   (United States)

^b TSINGHUA UNIVERSITY   (China)

^c INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

contact electrification; dual pass KPFM; phase shift change; surface potential measurement; tip sample interactive force

Indexed keywords

CHARACTERIZATION; ELECTRIC UTILITIES; ELECTRONIC PROPERTIES; NANOCANTILEVERS; PHASE SHIFT; PHASE SHIFTERS; PROBES; SPRINGS (COMPONENTS); SURFACE POTENTIAL;

CONTACT ELECTRIFICATION; DUAL-PASS KPFM; INTERACTIVE FORCES; SHIFT CHANGES; SURFACE POTENTIAL MEASUREMENTS;

SURFACE TOPOGRAPHY;

EID: 84960145338     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/acsnano.5b07418     Document Type: Article

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