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Volumn 13, Issue 6, 2013, Pages 2771-2776

In situ quantitative study of nanoscale triboelectrification and patterning

Author keywords

atomic force microscopy; nanogenerators; scanning Kelvin probe microscopy; TENG; Triboelectric

Indexed keywords

EXTERNAL ELECTRIC FIELD; NANOELECTRONIC DEVICES; NANOGENERATORS; QUANTITATIVE CHARACTERIZATION; SATURATED CONCENTRATIONS; SCANNING KELVIN PROBE MICROSCOPY; TENG; TRIBOELECTRIC;

EID: 84879112977     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl401006x     Document Type: Article
Times cited : (215)

References (28)
  • 1
  • 23
    • 84860830465 scopus 로고    scopus 로고
    • Williams, M. W. Aip Adv. 2012, 2 (1) 010701
    • (2012) Aip Adv. , vol.2 , Issue.1 , pp. 010701
    • Williams, M.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.