Probing local electronic transport at the organic single-crystal/dielectric interface

Advanced Materials

Volumn 19, Issue 17, 2007, Pages 2267-2273

  Luo, Yi ^a,c   Gustavo, Frederic ^a   Henry, Jean Yves ^a   Mathevet, Fabrice ^a,b,d   Lefloch, Francois ^a   Sanquer, Marc ^a   Rannou, Patrice ^a   Grévin, Benjamin ^a  

^a CEA GRENOBLE   (France)

^b CEA LETI   (France)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

^d UMR 7610   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIELECTRIC MATERIALS; ELECTRIC POTENTIAL; ELECTRON TRANSPORT PROPERTIES; ELECTROSTATIC FORCE; SCANNING ELECTRON MICROSCOPY;

BIAS DEPENDENCES; CHANNEL RESISTANCES; INTERFACIAL EFFECTS; SCANNING KELVIN PROBE MICROSCOPY (SKPM);

SINGLE CRYSTALS;

EID: 34548633995     PISSN: 09359648     EISSN: None     Source Type: Journal    
DOI: 10.1002/adma.200700913     Document Type: Article

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