Aberration-corrected STEM for atomic-resolution imaging and analysis

Journal of Microscopy

Volumn 259, Issue 3, 2015, Pages 165-172

  Krivanek, O L ^a,b   Lovejoy, T C ^a   Dellby, N ^a  

^a Nion Co Kirkland   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

Aberration correction; Electron energy loss spectroscopy; Electron monochromator; Energy analyzed Rutherford scattering; Energy dispersive X ray spectroscopy; High order aberrations; Monochromated electron beams; Scanning transmission electron microscopy (STEM); Vibrational spectroscopy

Indexed keywords

ABERRATIONS; ATOMS; DISSOCIATION; ELECTRON BEAMS; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONS; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY DISSIPATION; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY;

ABERRATION CORRECTION; ELECTRON ENERGY-LOSS SPECTROSCOPIES; ELECTRON MONOCHROMATORS; ELECTRON-BEAM; ENERGY; ENERGY DISPERSIVE X RAY SPECTROSCOPY; ENERGY-ANALYZED RUTHERFORD SCATTERING; HIGHER ORDER ABERRATIONS; MONOCHROMATED ELECTRON BEAM; RUTHERFORD'S SCATTERING; SCANNING TRANSMISSION ELECTRON MICROSCOPY;

ELECTRON ENERGY LOSS SPECTROSCOPY;

HYDROGEN;

ABERRATION CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPY; ARTICLE; ATOM; ATOMIC RESOLUTION IMAGING; AUGER ELECTRON SPECTROSCOPY; ELECTRIC POTENTIAL; ELECTRON; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROMETER; ELECTRON ENERGY LOSS SPECTROSCOPY; ENERGY; FAST ELECTRON RADIATION; ILLUMINATION; IMAGE ANALYSIS; INFRARED SPECTROMETRY; MOLECULAR IMAGING; OPTICS; PHOTON; PRIORITY JOURNAL; ROENTGEN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPE; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SPECTROMETER; SPECTROSCOPY; ULTRAVIOLET SPECTROSCOPY; VIBRATIONAL SPECTROSCOPY; X RAY;

EID: 84939463438     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/jmi.12254     Document Type: Article

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