Direct determination of the chemical bonding of individual impurities in graphene

Physical Review Letters

Volumn 109, Issue 20, 2012, Pages

  Zhou, Wu ^a,b   Kapetanakis, Myron D ^a,b   Prange, Micah P ^a,b,c   Pantelides, Sokrates T ^a,b   Pennycook, Stephen J ^a,b   Idrobo, Juan Carlos ^b  

^a VANDERBILT UNIVERSITY   (United States)

^b OAK RIDGE NATIONAL LABORATORY   (United States)

^c PACIFIC NORTHWEST NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL BONDINGS; DIRECT DETERMINATION; FIRST-PRINCIPLES CALCULATION; IMPURITIES IN; IMPURITY ATOMS; IMPURITY LEVEL; ORBITALS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SI ATOMS; TWO-DIMENSIONAL MATERIALS; Z-CONTRAST IMAGING;

ATOMS; CALCULATIONS; CHEMICAL BONDS; ELECTRON ENERGY LOSS SPECTROSCOPY; IMPURITIES; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

GRAPHENE;

EID: 84869029988     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.109.206803     Document Type: Article

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