Energy-filtered high-angle dark field mapping of ultra-light elements

Microscopy and Microanalysis

Volumn 20, Issue 3, 2014, Pages 558-559

  Lovejoy, T C ^a   Dellby, N ^a   Aoki, T ^b   Corbin, G J ^a   Hrncirik, P ^a   Szilagyi, Z S ^a   Krivanek, O L ^a  

^a Nion Co Kirkland   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84926366111     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927614004516     Document Type: Conference Paper

References (3)

1. OL Krivanek et al., Microscopy 62 (2013) 3-21.
2. OL Krivanek et al., Proceedings 2013 EMAG meeting, in print (2014).
3. OL Krivanek et al., these proceedings (2014).