Probing the bonding and electronic structure of single atom dopants in graphene with electron energy loss spectroscopy

Nano Letters

Volumn 13, Issue 10, 2012, Pages 4989-4995

  Ramasse, Quentin M ^a   Seaboume, Che R ^b   Kepaptsoglou, Despoina Maria ^a   Zan, Recep ^c   Bangert, Ursel ^c   Scott, Andrew J ^c  

^a SUPERSTEM LABORATORY   (United Kingdom)

^b UNIVERSITY OF LEEDS   (United Kingdom)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

Bonding; Doping; EELS; Electronic structure; Graphene; STEM

Indexed keywords

BONDING; CALCULATIONS; CRYSTAL ATOMIC STRUCTURE; DISSOCIATION; DOPING (ADDITIVES); ELECTRON EMISSION; ELECTRON ENERGY LEVELS; ELECTRON SCATTERING; ELECTRONIC STRUCTURE; ENERGY DISSIPATION; GRAPHENE; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; SCANNING ELECTRON MICROSCOPY; SIGNAL TO NOISE RATIO; SILICON; STEM (SCIENCE, TECHNOLOGY, ENGINEERING AND MATHEMATICS); TRANSMISSION ELECTRON MICROSCOPY;

AB INITIO CALCULATIONS; DEFECT GEOMETRY; FINE STRUCTURES; SCANNING TRANSMISSION ELECTRON MICROSCOPY; SIGNAL TO NOISE; SINGLE ATOMS; SPECTROSCOPIC DATA; STRUCTURE DIFFERENCE;

ELECTRON ENERGY LOSS SPECTROSCOPY;

EID: 85014024560     PISSN: 15306984     EISSN: 15306992     Source Type: Journal    
DOI: 10.1021/nl304187e     Document Type: Article

References (41)

1. Krivanek, O. L; Dellby, N.; Murfitt, M F.; Chisholm, M.; Pennycook T. J.; Suenaga, K; Nicoiosi, V. Ultramicroscopy 2010, 110, 93S-94S.
2. Meyer, J. C; Kisielowski, C; Erni, R; Rossell, M. D.; Crommie, M. F.; Zettl, A. Nano Lett. 2008, 8, 3S82.
3. Schubert, M.; Rheinlander, B.; Franke, E.; Neumann, H.; Tiwald, T. E; WooUam, J. A.; Hahn, J.; Richter, F. Phys. Rev. B 1997, 56, 13306.
4. Geim, A K. Science 2009, 324, 1530-1S34.
5. Chen, J.H.; Li, L; CuUen, W. G.; Williams, E. D.; Fuhrer, M. S. Nat Phys. 2011, 7, 535.
6. Ponomarenko, L. A.; Geim, A K; Zhukov, A A; Jalil, R.; Morozov, S. V.; Novoselov, K. S.; Grigorieva, I. V.; Hill, E. H.; Cheianov, V. V.; Falko, V. 1.; Watanabe, K; Taniguchi, T.; Gorbachev, R. V. Nat. Phys. 2011, 7 (12), 9S8-961.
7. Alem, N.; Ramasse, Q. M.; Seaboume, C. R; Yazyev, O. V.; Erickson, K.; Sarahan, M. Ci Kisielowski, C; Scott, A J.; l-ouie, S. G.; Zettl, A Phys. Rev. Lett. 2012, 109, 205502.
8. Hansen, L P.; Ramasse, Q. M.; Kisielowski, C; Brorson, M.; Johnson, E.; Topsoe, H.; Helveg, S. Anew. Chem., lnt Ed. 2011, 50, 10153-10156.
9. Knvanek, O. L; Chisholm, M. F.; Nicoiosi, V.j Pennycook, T. J.; Corbin, G J.; Dellby, N.; Murfitt, M. F.; Own, C. S.; Szilagyi, Z. S.; Chdey, M. P.; Pantelides, S. T.; Pennycook, S. J. Nature 2010, 464, 571-574.
10. Varela, M.; Findlay, S. D.; Lupini, A Ri Christen, R M; Borisevich, A. Y.; Dellby, N.; Knvanek O. L; Nellist, P. D.; Oiley, M. P.; Allen, L J.; Pennycook, S. J. Phys. Rev. Lett 2004, 92, 095502.
11. Suenaga, K; Sato, Y.; Liu, Z.; Kataura, H.; Okazaki, T.; Kimoto, K.; Sawada, H.; Sasaki, T.; Omoto, K.; Tornita, T.; Kaneyama, T.; Kondo, Y. Nature Chem. 2009, I, 415-418.
12. Gunawan, A A; Mkhoyan, K A; Wills, A W.; Thomas, M. G.; Noms, DJ. Nono Lett 2011, II, 5SS3-5SS7.
13. Ramasse, Q. M.; Zan, R; Bangert, U.; Boukhvalov, D. W.; Son, Y.-S.; Novoselov, K. S. ACS Nano 2012, 6, 4063-4071.
14. Lovejoy, T. C; Ramasse, Cv M.; Falke, M.; Kaeppel, A; Terborg, R; Zan, R; Dellby, N.; Krivanek, O. L. Appi Phys. Lett. 2012, 100, 154101.
15. Suenaga, K; Okazaki, T.; Okunishi, E.; Matsumura, S. Nat. Photonics 2012, 6, 545-548.
16. Suenaga, K; Koshino, M Nature 2012, 468, 1088-1090.
17. Suenaga, K; Kobayashi, H.; Koshino, M. Phys. Rev. Lett. 2012, WS, 075501.
18. Hartel, P.; Rose, R; Dinges, C. Ultramicroscopy 1996, 63, 93-114.
19. Krivanek, O. L; Zhou, W.; Chisholm, M. F.; Dellby, N.; Lovejoy, T. C; Ramasse, Q M.; Idrobo, J.-C. GentleSTEM of Single Atoms: Low keV Imaging and Analysis at the Ultimate Detection Limits. In Low Voltage Electron Microscopy: Principles and Applications; Bell, D. C, Erdman, N, Eds.; Wiley: London, 2012; pp 119-161.
20. Li, X. S-i Cai, W. W.; An, J. H.; Kim, S.; Nah, J.; Yang, D. X.; Piner, R.; VeUmakanni, A; Jung, I.; Tutuc, E.; Banerjee, S. K.; Colombo, L; Ruoff, R. S. Science 2009, 324, 1212-1214.
21. Reina, A; Jia, X; Ho, J.; Nezkh, D.; Son, R; Bulovic, V.; Dresselhaus, M. S.; Kong, J. Nano Lett. 2009, 9, 30-35.
22. Stone, A J.; Wales, D. J. Chem. Phys. Lett. 1986, 128, 501.
23. Banhart, F. Rep. Prog. Phys. 1999, 62, 1181.
24. Meyer, J. C; Eder, F.; Kurasch, S.; Skakalova, V.; Kotakoski, J.; Park, H. ].; Roth, S.; Chuvilin, A; Eyhusen, S.; Benner, G.; Krasheninnikov, A; Kaiser, U. Phys. Rev. Lett 2012, 108, 196102.
25. Suenaga, K Private Communication, 2012.
26. Banhart, F.; Kotakoski, J.; Krasheninnikov, A V. ACS Nano 2011, 5, 26.
27. Kotakoski, J.; Krasheninnikov, A V.; Kaiser, U.; Meyer, J. C. Phys. Rev. Lett. 2011, 106, 105505.
28. Ishizulca, K; Abe, L In Instrumentation and Methodology, Proceedings of the 13th European Microscopy Congress: Antwerp, Belgium, August 22-27, 2004;
29. Schryvers, D., Timmermans, J.-P-, Eds.; Belgium Society for Microscopy: Antwerp, Belgium, 2004, Vol. I, p 117. DeconvHAADF is available commercially from HREM Research Ine (www.hremresearch.com).
30. Zan, R; Ramasse, Q. M.; Bangert, U.; Novoselov, K S. Nano Lett. 2012, 12, 3936-3940.
31. Zhou, W.; Lee, J.; Nanda, J.; Pantelides, S. T.; Pennycook S. J.; ldrobo, J.-C. Nut NanotechnoL 2012, 7, 161-165.
32. Zhou, W.; Oxley, M. P.; Lupini, A R; Krivanek, O. L; Pennycook, S-J.; Idrobo, J.-C. Microsc. Microanal. 2012, DOI 10.1017/S14319276120I3335.
33. Bote, D.; Salvar, F.; Jablonslu, A; Powel, C. J. At Data Nud. Data Tables 2009, 95, 871.
34. Clark, S. J.; Segali, M. D.j Pickard, C. J.; Hasnip, P. J.; Probert, M. J.; Refson, K.; Payne, M. C. Z. Kristallogr. 2005, 220, 567-570.
35. Broyden, C. G. IMA J. Appl. Math 1970, 6, 76.
36. Broyden, C. G. IMA J. Appil Math. 1970, 6, 222.
37. Fletcher, R Cemput J. 1970, 13, 23.
38. Goldfarb. D. Mdh Compul. 1970, 24, 23.
39. Shanno, D. F. Mal Comnut 1970, 24, 647.
40. Zhou, W.; Kapetanakis, M. D.; Prange, M. P.; Pantelides, S. T.; Pennycook, S. J.; Idrobo, J.-C. Pfrys. Rev. Lett 2012, 109, 206803.
41. Milman, V.; Refson, K.; Clark, S. J.; Pickard, C. J.; Yates, J. R; Gao, S.-P; Hasnip, P. J.; Probert, M. 1. J.; Perlov, A; Segall, M. D. J. Mol Struct: THEOCIIEM 2010, 954, 22-35.