Single atom identification by energy dispersive x-ray spectroscopy

Applied Physics Letters

Volumn 100, Issue 15, 2012, Pages

  Lovejoy, T C ^a   Ramasse, Q M ^b   Falke, M ^c   Kaeppel, A ^c   Terborg, R ^c   Zan, R ^d   Dellby, N ^a   Krivanek, O L ^a  

^a Nion Co Kirkland   (United States)

^b SUPERSTEM LABORATORY   (United Kingdom)

^c BRUKER DALTONIK GMBH   (Germany)

^d UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

ABERRATION-CORRECTED; ELECTRON ENERGY LOSS SPECTRUM; ENERGY DISPERSIVE X RAY SPECTROSCOPY; IMPURITY ATOMS; SCANNING TRANSMISSION ELECTRON MICROSCOPES; SIGNAL INTENSITIES; SINGLE ATOMS;

ELECTRON ENERGY LOSS SPECTROSCOPY; GRAPHENE; MONOLAYERS; PLATINUM;

X RAY SPECTROSCOPY;

EID: 84859805961     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3701598     Document Type: Article

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