Detection of photons emitted from single erbium atoms in energy-dispersive X-ray spectroscopy

Nature Photonics

Volumn 6, Issue 8, 2012, Pages 545-548

  Suenaga, Kazu ^a   Okazaki, Toshiya ^a   Okunishi, Eiji ^b   Matsumura, Syo ^c  

^a NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

^b JEOL LTD   (Japan)

^c KYUSHU UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON ENERGY LEVELS; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SCATTERING; ENERGY DISPERSIVE SPECTROSCOPY; ENERGY DISSIPATION; ERBIUM; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOTECHNOLOGY; PHOTONS; PROBES; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

ABERRATION-CORRECTED SCANNING TRANSMISSION ELECTRON MICROSCOPIES; CHARACTERISTIC X RAYS; DETECTION OF PHOTONS; ENERGY DISPERSIVE X RAY SPECTROSCOPY; FLUORESCENCE YIELD; HIGH CURRENTS; NANOSCALE DEVICE; SINGLE QUANTUM;

ATOMS;

EID: 84864535617     PISSN: 17494885     EISSN: 17494893     Source Type: Journal    
DOI: 10.1038/nphoton.2012.148     Document Type: Article

References (16)

1. Suenaga, K. et al. Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage. Nature Chem. 1, 415-418 (2009).
2. Krivanek, O. et al. Ultramicroscopy 110, 935-945 (2010).
3. Suenaga, K. & Koshino, M. Atom-by-atom spectroscopy at graphene edge. Nature 468, 1088-1090 (2010).
4. Suenaga, K. et al. Element-selective single atom imaging. Science 290, 2280-2282 (2000). (Pubitemid 32041563)
5. Varela, M. et al. Spectroscopic imaging of single atoms within a bulk solid. Phys. Rev. Lett. 92, 095502 (2004).
6. Egerton, R. in Electron Energy-Loss Spectroscopy in the Electron Microscope 3rd edn (Springer, 2011).
7. Muller, D. & Silcox, J. Delocalization in elastic scattering. Ultramicroscopy 59, 195-213 (1995).
8. Suenaga, K., Iizumi, Y. & Okazaki, T. Single atom spectroscopy with reduced delocalization effect using a 30 kV-STEM. Euro. Phys. J. 54, 033508 (2011).
9. Watanabe, M. in Scanning Transmission Electron Microscopy, Imaging and Analysis (Pennycook, S. J. & Nellist, P. D. eds) Ch. 7, 291-351 (Springer, 2011).
10. Krause,M& Oliver, J. Natural widths of atomic K and L lines. J. Phys. Chem. Ref. Data 8, 329-338 (1979).
11. Chu, M.-W., Liou, S. C., Chang, C. P., Choa, F.-S. & Chen, C. H. Emergent chemical mapping at atomic-column resolution by energy-dispersive X-ray spectroscopy in an aberration-corrected electron microscope. Phys. Rev. Lett. 104, 196101 (2010).
12. Watanabe, M., Kanno, M. & Okunishi, E. Atomic-resolution elemental mapping by EELS and XEDS in aberration corrected STEM. JEOL News 45, 8-15 (2010).
13. d'Alfonso, A. J., Freitag, B., Klenov, D. & Allen, L. J. Atomic-resolution chemical mapping using energy-dispersive X-ray spectroscopy. Phys. Rev. B 81, 100101 (2010).
14. Terauchi, M. et al. Ultrasoft-X-ray emission spectroscopy using a newly designed wavelength-dispersive spectrometer attached to a transmission electron microscope. J. Electron Microsc. 61, 1-8 (2012).
15. Zagonel, L. et al. Nanometer scale spectral imaging of quantum emitters in nanowires and its correlation to their atomically resolved structure. Nano Lett. 11, 568-573 (2011).
16. Lovejoy, T. C. et al. Single atom identification by energy dispersive X-ray spectroscopy. Appl. Phys. Lett. 100, 154101 (2012).