Recovery of permittivity and depth from near-field data as a step toward infrared nanotomography

ACS Nano

Volumn 8, Issue 7, 2014, Pages 6911-6921

  Govyadinov, Alexander A ^a   Mastel, Stefan ^a   Golmar, Federico ^a,b   Chuvilin, Andrey ^a,c   Carney, P Scott ^d   Hillenbrand, Rainer ^a,c  

^a CIC NANOGUNE   (Spain)

^b Facultad de Ciencias Naturales e Instituto M Lillo   (Argentina)

^c BASQUE FOUNDATION FOR SCIENCE   (Spain)

^d University of Illinois at Urbana Champaign   (United States)

Author keywords

chemical imaging; ellipsometry; inverse problems; nanotomography; near field microscopy; s SNOM; thin films

Indexed keywords

COMPOSITE MATERIALS; ELLIPSOMETRY; INVERSE PROBLEMS; NANOTECHNOLOGY; PERMITTIVITY; THIN FILMS;

CHEMICAL IDENTIFICATION; CHEMICAL IMAGING; EXPERIMENTAL DEMONSTRATIONS; NANOTOMOGRAPHY; NEAR FIELD MICROSCOPY; NEAR-FIELD MEASUREMENT; QUANTITATIVE EXTRACTION; S-SNOM;

CHEMICAL ANALYSIS;

NANOMATERIAL; SILICON DIOXIDE;

CHEMISTRY; INFRARED RADIATION; NANOTECHNOLOGY; PROCEDURES; TOMOGRAPHY;

INFRARED RAYS; NANOSTRUCTURES; NANOTECHNOLOGY; SILICON DIOXIDE; TOMOGRAPHY;

EID: 84904739831     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn5016314     Document Type: Article

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