Phase in nanooptics

ACS Nano

Volumn 6, Issue 1, 2012, Pages 8-12

  Carney, P Scott ^a   Deutsch, Bradley ^b   Govyadinov, Alexander A ^c   Hillenbrand, Rainer ^c,d  

^a University of Illinois at Urbana Champaign   (United States)

^b UNIVERSITY OF ROCHESTER   (United States)

^c CIC NANOGUNE   (Spain)

^d BASQUE FOUNDATION FOR SCIENCE   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

AMPLITUDE MEASUREMENTS; IN-PHASE MEASUREMENT; NANOOPTICS; QUANTITATIVE PHASE MEASUREMENT;

ENGINEERING; NANOTECHNOLOGY;

PHASE MEASUREMENT;

NANOPARTICLE;

ARTIFACT; COMPUTER ASSISTED DIAGNOSIS; CRYSTALLOGRAPHY; METHODOLOGY; NOTE; SCANNING PROBE MICROSCOPY; THREE DIMENSIONAL IMAGING; ULTRASTRUCTURE;

ARTIFACTS; CRYSTALLOGRAPHY; IMAGE INTERPRETATION, COMPUTER-ASSISTED; IMAGING, THREE-DIMENSIONAL; MICROSCOPY, SCANNING PROBE; NANOPARTICLES;

EID: 84856155919     PISSN: 19360851     EISSN: 1936086X     Source Type: Journal    
DOI: 10.1021/nn205008y     Document Type: Review

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