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Physical Review Letters

Volumn 108, Issue 16, 2012, Pages

Pseudopulse near-field subsurface tomography

(4) Gaikovich, K P a Gaikovich, P K a Maksimovitch, Ye S b Badeev, V A b

a INSTITUTE FOR PHYSICS OF MICROSTRUCTURES (Russian Federation)

b INSTITUTE OF APPLIED PHYSICS (Belarus)

Author keywords

[No Author keywords available]

Indexed keywords

DEPTH DEPENDENCE; DEPTH RESOLUTION; HOMOGENEOUS DIELECTRICS; INHOMOGENEOUS DIELECTRICS; INVERSE SCATTERING PROBLEMS; MULTI FREQUENCY; NEAR-FIELD; NEAR-FIELD SCANNING; RAYLEIGH DIFFRACTION LIMIT;

SURFACE SCATTERING;

TOMOGRAPHY;

EID: 84860174779 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.108.163902 Document Type: Article

Times cited : (33)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.