SCOPUS 정보 검색 플랫폼

Superlattices and Microstructures

Volumn 73, Issue , 2014, Pages 268-274

Ultra-smooth and lattice relaxed ZnO thin films

(3) Fouda, A N a Duraia, El Shazly M a,b Eid, E A c

a Suez Canal University (Egypt)

b Texas State University (United States)

c HIGHER TECHNOLOGICAL INSTITUTE (Egypt)

Author keywords

Lattice relaxation; Raman spectroscopy; Vacuum annealing; Zinc oxide thin films

Indexed keywords

ATOMIC FORCE MICROSCOPY; EPITAXIAL GROWTH; MAGNETRON SPUTTERING; METALLIC FILMS; OPTICAL FILMS; RAMAN SPECTROSCOPY; SAPPHIRE; SCANNING ELECTRON MICROSCOPY; VACUUM; X RAY DIFFRACTION; ZINC OXIDE;

HIGH-TEMPERATURE ANNEALING; HIGH-TEMPERATURE VACUUM ANNEALING; LATTICE RELAXATION; LONGITUDINAL OPTICAL MODES; RADIO FREQUENCY MAGNETRON SPUTTERING; ROOT MEAN SQUARE ROUGHNESS; VACUUM-ANNEALING; ZINC OXIDE THIN FILMS;

ANNEALING;

EID: 84903128309 PISSN: 07496036 EISSN: 10963677 Source Type: Journal
DOI: 10.1016/j.spmi.2014.05.022 Document Type: Article

Times cited : (8)

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