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Current Applied Physics

Volumn 14, Issue 1, 2014, Pages 30-33

Thermal stress induced band gap variation of ZnO thin films

(2) Jeong, Y E a Park, S a

a Pusan National University (South Korea)

Author keywords

Annealing environment; Growth temperature; Optical band gap; ZnO thin films

Indexed keywords

ANNEALING ENVIRONMENT; BAND GAP VARIATION; INTERFACIAL STRAIN; POST ANNEALING; POST-ANNEALED SAMPLES; RF MAGNETRONS; STRUCTURAL EFFECT; ZNO THIN FILM;

ANNEALING; GROWTH TEMPERATURE; METALLIC FILMS; OPTICAL BAND GAPS;

OPTICAL FILMS;

EID: 84887067214 PISSN: 15671739 EISSN: None Source Type: Journal
DOI: 10.1016/j.cap.2013.10.003 Document Type: Article

Times cited : (10)

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