Correlations between 1/ f noise and thermal treatment of Al-doped ZnO thin films deposited by direct current sputtering

Journal of Applied Physics

Volumn 115, Issue 20, 2014, Pages

  Barhoumi, A ^a   Leroy, G ^b   Yang, L ^c   Gest, J ^b   Boughzala, H ^d   Duponchel, B ^b   Guermazi, S ^a   Carru, J C ^b  

^a University of Sfax   (Tunisia)

^b UNIV LILLE   (France)

^c Hebei Union University   (China)

^d FACULTÉ DES SCIENCES DE TUNIS   (Tunisia)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; GLASS; GRAIN BOUNDARIES; METALLIC FILMS; OPTICAL FILMS; SUBSTRATES; THIN FILMS; X RAY DIFFRACTION; ZINC SULFIDE;

AL-DOPED ZNO THIN FILMS; CRYSTALLINE STRUCTURE; DIFFERENT SUBSTRATES; DIRECT CURRENT SPUTTERING; GLASS SUBSTRATES; HEXAGONAL WURTZITE STRUCTURE; NOISE MEASUREMENTS; PREFERRED ORIENTATIONS;

ALUMINUM;

EID: 84901992205     PISSN: 00218979     EISSN: 10897550     Source Type: Journal    
DOI: 10.1063/1.4879095     Document Type: Article

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