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Volumn 47, Issue 8, 2012, Pages 3516-3521
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Effect of temperature on the properties of Al:ZnO films deposited by magnetron sputtering with inborn surface texture
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Author keywords
[No Author keywords available]
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Indexed keywords
AZO FILMS;
EFFECT OF TEMPERATURE;
ETCHING PROCESS;
GLASS SUBSTRATES;
GRAIN SIZE;
HIGH TRANSMITTANCE;
LINEAR RELATIONSHIPS;
POWER DENSITIES;
PROPERTIES OF AL;
ROOM TEMPERATURE;
ROOT MEAN SQUARE ROUGHNESS;
SPUTTERING PARAMETERS;
SUBSTRATE TEMPERATURE;
SURFACE TEXTURES;
WORKING PRESSURES;
ATOMIC FORCE MICROSCOPY;
CARRIER CONCENTRATION;
ELECTRIC PROPERTIES;
OPTICAL FILMS;
SCANNING ELECTRON MICROSCOPY;
SUBSTRATES;
X RAY DIFFRACTION;
ZINC OXIDE;
TEXTURES;
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EID: 84857641378
PISSN: 00222461
EISSN: 15734803
Source Type: Journal
DOI: 10.1007/s10853-011-6196-y Document Type: Article |
Times cited : (10)
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References (32)
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