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Volumn 149, Issue 1, 2002, Pages 3-12

1/f noise in homogeneous and inhomogeneous media

Author keywords

[No Author keywords available]

Indexed keywords

AMPLIFIERS (ELECTRONIC); BANDWIDTH; CHARGE CARRIERS; CRYSTALS; ELECTRIC CONDUCTANCE; ELECTRIC CURRENTS; ELECTRIC IMPEDANCE; ELECTRIC RESISTANCE; GRAIN BOUNDARIES; INTERFACES (MATERIALS);

EID: 0036477697     PISSN: 13502409     EISSN: None     Source Type: Journal    
DOI: 10.1049/ip-cds:20020329     Document Type: Conference Paper
Times cited : (45)

References (52)
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    • Hooge, F.N.1
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    • Modified 1/f trapping noise theory and experiments in MOS transistors biased from weak to strong inversion, influence of interface states
    • (1984) IEEE Trans. Electron Devices , vol.ED-31 , pp. 1190
    • Reimbold, G.1
  • 11
    • 35949011715 scopus 로고
    • 1/f noise and other slow, nonexponential kinetics in condensed matter
    • (1988) Rev. Mod. Phys. , vol.60 , Issue.2 , pp. 537-571
    • Weismann, M.B.1
  • 19
    • 0000880386 scopus 로고
    • On fluctuations with a 1/f spectrum and the non-existence of the quantum 1/f noise effect
    • (1988) Rev. Solid State Sci. , vol.2 , Issue.4 , pp. 659-680
    • Kiss, L.B.1
  • 20
    • 4243209341 scopus 로고    scopus 로고
    • Noise in materials-low frequency noise as a diagnostic tool for reliability and quality assessment of electronic devices
    • Frontier Group, Vercorin, Suisse, ISBN 2-86332-251-6
    • (2001) Fluctuations et bruit , pp. 67-96
    • Vandamme, L.K.J.1
  • 33
    • 0024639899 scopus 로고
    • Volume and temperature dependence of the 1/f noise parameter α in Si
    • (1989) Physica B , vol.154 B , pp. 214-224
    • Clevers, R.H.M.1
  • 39
    • 0026413573 scopus 로고
    • 1/f noise at room temperature in n-type GaAs grown by molecular beam epitaxy
    • (1991) Physica B , vol.B172 , pp. 319-323
    • Ren, L.1    Leys, M.R.2
  • 51
    • 0001350590 scopus 로고    scopus 로고
    • Bulk noise processes and their correlation to structural imperfections in magnesium-doped p-type GaN grown on sapphire
    • (2000) J. Appl. Phys. , vol.87 , Issue.11 , pp. 7892-7895
    • Rice, A.K.1    Malloy, K.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.