Ohmic and Schottky nanocontacts on ZnO nanorods

Proceedings of the IEEE Conference on Nanotechnology

Volumn 1, Issue , 2003, Pages 410-413

  Park, W I ^a   Yi, G C ^a  

^a Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Atomic force microscopy; Atomic layer deposition; Atomic measurements; Electric variables; Electrons; Epitaxial growth; Epitaxial layers; Fabrication; Nanocontacts; Zinc oxide

Indexed keywords

ATOMIC FORCE MICROSCOPY; ATOMIC LAYER DEPOSITION; ELECTRIC VARIABLES MEASUREMENT; ELECTRONS; EPITAXIAL GROWTH; EPITAXIAL LAYERS; FABRICATION; HETEROJUNCTIONS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; METALLORGANIC VAPOR PHASE EPITAXY; NANORODS; NANOTECHNOLOGY; TRANSMISSION ELECTRON MICROSCOPY; ZINC OXIDE;

ATOMIC MEASUREMENTS; ATOMICALLY SHARP INTERFACE; CONDUCTING PROBE ATOMIC FORCE MICROSCOPIES; ELECTRIC VARIABLES; ELECTRICAL CHARACTERISTIC; I-V CHARACTERISTIC CURVE; METAL-ORGANIC VAPOR PHASE EPITAXY; NANOCONTACTS;

METALS;

EID: 84883717625     PISSN: 19449399     EISSN: 19449380     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2003.1231805     Document Type: Conference Paper

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