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Volumn 53, Issue 4 SPEC. ISSUE, 2014, Pages

Fabrication and characterization of BaSi2 epitaxial films over 1 μm in thickness on Si(111)

Author keywords

[No Author keywords available]

Indexed keywords

X RAY DIFFRACTION;

EID: 84901477224     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.7567/JJAP.53.04ER04     Document Type: Conference Paper
Times cited : (31)

References (28)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.