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Volumn 29, Issue 5, 2014, Pages 2393-2407

An experimental investigation of the tradeoff between switching losses and EMI generation with hard-switched All-Si, Si-SiC, and All-SiC device combinations

Author keywords

Electromagnetic compatibility; electromagnetic interference (EMI); insulated gate bipolar transistors (IGBTs); silicon carbide (SiC); variable speed drives

Indexed keywords

ELECTRICAL MACHINE; EXPERIMENTAL INVESTIGATIONS; FAST RECOVERY DIODES; PERFORMANCE BENEFITS; SILICON CARBIDES (SIC); SPECTRAL AMPLITUDE; SWITCHING POWER DEVICES; SWITCHING WAVEFORMS;

EID: 84893039498     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2013.2278919     Document Type: Article
Times cited : (421)

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