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Volumn 27, Issue 2, 2012, Pages 1013-1024

Temperature-dependent characteristics of SiC devices: Performance evaluation and loss calculation

Author keywords

High temperature; JFET; loss; Schottky barrier diode (SBD); silicon carbide (SiC); switching

Indexed keywords

AC-DC-AC CONVERTERS; ANTI-PARALLEL DIODES; BODY DIODE; BRIDGE TESTS; CONDUCTION LOSS; CONDUCTION PATHS; HIGH TEMPERATURE; LOSS CALCULATION; OPERATING TEMPERATURE; PERFORMANCE EVALUATION; REVERSE RECOVERY; SCHOTTKY BARRIER DIODE (SBD); SCHOTTKY DIODES; SEMICONDUCTOR LOSS; SI DEVICES; SIC DEVICES; SIC SCHOTTKY DIODE; STEADY STATE PERFORMANCE; SWITCHING BEHAVIORS; SWITCHING LOSS; TEMPERATURE DEPENDENT;

EID: 84862920940     PISSN: 08858993     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPEL.2011.2159624     Document Type: Article
Times cited : (87)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.