SCOPUS 정보 검색 플랫폼

Scanning Probe Microscopy

Volumn 2, Issue , 2007, Pages 943-973

Resistive probe storage: Read/write mechanism

(2) Hong, Seungbum a Park, Noyeol b

a Samsung Advanced Institute of Technology (SAIT) (South Korea)

b SAMSUNG Electronics (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 84891438298 PISSN: None EISSN: None Source Type: Book
DOI: 10.1007/978-0-387-28668-6_36 Document Type: Chapter

Times cited : (11)

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