Scaling effect on statistical behavior of switching parameters of ferroelectric capacitors

Applied Physics Letters

Volumn 75, Issue 10, 1999, Pages 1452-1454

  Gruverman, Alexei ^a  

^a SONY CORPORATION   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; DATA STORAGE EQUIPMENT; DIELECTRIC FILMS; FERROELECTRIC DEVICES; FERROELECTRIC MATERIALS; GRAIN SIZE AND SHAPE; PIEZOELECTRICITY; POLARIZATION; STATISTICAL METHODS; STRONTIUM COMPOUNDS;

FERROELECTRIC CAPACITORS; POLARIZATION SWITCHING; SCANNING FORCE MICROSCOPY (SFM); STRONTIUM BARIUM TANTALUM OXIDE;

CERAMIC CAPACITORS;

EID: 0032613801     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.124722     Document Type: Article

References (16)

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