Boosting efficiency of fault detection and recovery through application-specific comparison and checkpointing

Proceedings of the ACM SIGPLAN Conference on Languages, Compilers, and Tools for Embedded Systems (LCTES)

Volumn , Issue , 2013, Pages 13-19

  Chen, Hao ^a   Yang, Chengmo ^a  

^a UNIVERSITY OF DELAWARE   (United States)

Author keywords

Application Specific optimization; Checkpointing; Fault detection recovery; Reliability

Indexed keywords

APPLICATION-SPECIFIC OPTIMIZATIONS; BOOSTING EFFICIENCY; CHECK POINTING; DATA-FLOW INFORMATION; FAULT COVERAGES; FAULT TOLERANCE TECHNIQUES; SEMICONDUCTOR INDUSTRY; TECHNOLOGY SCALING;

APPLICATION PROGRAMS; EMBEDDED SYSTEMS; FAULT DETECTION; PROGRAM COMPILERS; RECOVERY; RELIABILITY; SEMICONDUCTOR DEVICE MANUFACTURE; TOOLS;

FAULT TOLERANCE;

EID: 84890520190     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2465554.2465562     Document Type: Conference Paper

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