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Volumn , Issue , 2013, Pages 119-154

Displacement Current Measurement for Exploring Charge Carrier Dynamics in Organic Semiconductor Devices

Author keywords

Charge carrier behavior; Energy gap; Interface dipole; OFET; OLED; Organic semiconductor; Sweep rate

Indexed keywords


EID: 84878358642     PISSN: None     EISSN: None     Source Type: Book    
DOI: 10.1002/9783527654949.ch5     Document Type: Chapter
Times cited : (7)

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