Nonradiative recombination centers and electrical aging of organic light-emitting diodes: Direct connection between accumulation of trapped charge and luminance loss

Journal of Applied Physics

Volumn 93, Issue 2, 2003, Pages 1108-1119

  Kondakov, D Y ^a   Sandifer, J R ^a   Tang, C W ^a   Young, R H ^b  

^a EASTMAN KODAK COMPANY   (United States)

^b UNIVERSITY OF ROCHESTER   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ANODES; CAPACITANCE; CATHODES; ELECTRIC POTENTIAL; ELECTROLUMINESCENCE; INTERFACES (MATERIALS); SEMICONDUCTING ORGANIC COMPOUNDS;

ORGANIC LIGHT-EMITTING DIODES (OLED);

LIGHT EMITTING DIODES;

EID: 0037439323     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1531231     Document Type: Article

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