Charge accumulation at organic semiconductor interfaces due to a permanent dipole moment and its orientational order in bilayer devices

Journal of Applied Physics

Volumn 111, Issue 11, 2012, Pages

  Noguchi, Yutaka ^a,b   Miyazaki, Yukimasa ^a   Tanaka, Yuya ^a   Sato, Naoki ^a   Nakayama, Yasuo ^a   Schmidt, Tobias D ^c   Brütting, Wolfgang ^c   Ishii, Hisao ^a  

^a CHIBA UNIVERSITY   (Japan)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c UNIVERSITY OF AUGSBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ACCUMULATED CHARGE; BI-LAYER DEVICES; BI-LAYER STRUCTURE; CHARGE ACCUMULATION; CHARGE BEHAVIOR; CHARGE CARRIER DYNAMICS; DEVICE OPERATIONS; DISPLACEMENT CURRENT MEASUREMENTS; EVAPORATED FILMS; HETERO-INTERFACES; IMPEDANCE SPECTROSCOPY; INTERFACE CHARGE; KELVIN PROBE MEASUREMENTS; MULTILAYER ORGANIC LIGHT-EMITTING DIODE; NONPOLAR MOLECULES; ORIENTATIONAL ORDERS; PERMANENT DIPOLES; POLAR MOLECULES; POTENTIAL FLUCTUATIONS; POTENTIAL PROFILES; SEMICONDUCTOR INTERFACES;

BENZENE; CATHODES; CHARGE CARRIERS; DEGRADATION; DIPOLE MOMENT; ELECTRIC FIELD EFFECTS; MOLECULES; MULTILAYERS; NAPHTHALENE; POLARIZATION; SEMICONDUCTOR DEVICES;

LIGHT EMITTING DIODES;

EID: 84863325165     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.4724349     Document Type: Conference Paper

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