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Volumn 92, Issue 15, 2008, Pages

Photoemission measurement of extremely insulating materials: Capacitive photocurrent detection in photoelectron yield spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

MICA; PHOTOCURRENTS; PHOTOELECTRON SPECTROSCOPY; PHOTOEMISSION; PRESSURE EFFECTS; SUBSTRATES;

EID: 42349116897     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2908888     Document Type: Article
Times cited : (58)

References (20)
  • 1
    • 42349098911 scopus 로고
    • in Practical Surface Analysis, edited by D. Briggs and M. P. Seah 2nd ed. (Wiley, New York), Vol., Appendix 2.
    • M. P. Seah, in Practical Surface Analysis, edited by, D. Briggs, and, M. P. Seah, 2nd ed. (Wiley, New York, 1990), Vol. 1, Appendix 2.
    • (1990) , vol.1
    • Seah, M.P.1
  • 8
    • 0034188096 scopus 로고    scopus 로고
    • J. Szuber, Vacuum 57, 209 (2000).
    • (2000) Vacuum , vol.57 , pp. 209
    • Szuber, J.1
  • 9
    • 42349104319 scopus 로고    scopus 로고
    • Electronic Processed in Organic Crystals and Polymers, 2nd ed. (Oxford Science, New York), Cha.
    • M. Pope and C. E. Swenberg, Electronic Processed in Organic Crystals and Polymers, 2nd ed. (Oxford Science, New York, 1999), Chap..
    • (1999)
    • Pope, M.1    Swenberg, C.E.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.