Displacement current measurement as a tool to characterize organic field effect transistors

Synthetic Metals

Volumn 153, Issue 1-3, 2005, Pages 253-256

  Ogawa, Satoshi ^a   Naijo, Tatsuo ^a   Kimura, Yasuo ^a   Ishii, Hisao ^a   Niwano, Michio ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Carrier injection properties; Field Effect Transistors; Metal Semiconductor interface; Organic semiconductors based on conjugated molecules; Schottkey barrier; Switches

Indexed keywords

CHARGE CARRIERS; ELECTRIC CURRENTS; ELECTRODES; SCHOTTKY BARRIER DIODES;

CARRIER INJECTION PROPERTIES; ORGANIC SEMICONDUCTORS BASED ON CONJUGATED MOLECULES; SEMICONDUCTOR INTERFACE;

FIELD EFFECT TRANSISTORS;

EID: 24644487390     PISSN: 03796779     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.synthmet.2005.07.267     Document Type: Conference Paper

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