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Volumn 108, Issue 7, 2010, Pages

Variable sensitivity of organic light-emitting diodes to operation-induced chemical degradation: Nature of the antagonistic relationship between lifetime and efficiency

(2) Kondakov, Denis Y a Young, Ralph H b

a OLED Consulting (United States)

b UNIVERSITY OF ROCHESTER (United States)

Author keywords

[No Author keywords available]

Indexed keywords

BOND-BREAKING; CHEMICAL CHANGE; CHEMICAL DEGRADATION; DEGRADATION PRODUCTS; DEVICE EFFICIENCY; EMISSION ZONE; HIGH VOLTAGE DEVICES; HIGH-VOLTAGES; HOLE-TRANSPORTING MATERIALS; LIGHT EMITTING LAYERS; LOW OPERATING VOLTAGE; LOW-VOLTAGE; LOW-VOLTAGE DEVICES; LUMINANCE EFFICIENCY; LUMINESCENT EFFICIENCY; OPERATING VOLTAGE; VOLTAGE DEVICES;

ELECTRIC FIELDS; ELECTRONIC EQUIPMENT; EXCITED STATES; FLUORESCENCE; LIGHT EMISSION; LIGHT EMITTING DIODES; LUMINANCE; ORGANIC LIGHT EMITTING DIODES (OLED);

DEGRADATION;

EID: 77958181081 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3483251 Document Type: Article

Times cited : (31)

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