Carrier Injection Characteristics in Organic Field Effect Transistors Studied by Displacement Current Measurement

Japanese Journal of Applied Physics, Part 2: Letters

Volumn 42, Issue 10 B, 2003, Pages

  Ogawa, Satoshi ^a   Kimura, Yasuo ^a   Ishii, Hisao ^a   Niwano, Michio ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

C60; Displacement current measurement; Field effect; Organic transistor; Pentacene

Indexed keywords

CAPACITANCE; CMOS INTEGRATED CIRCUITS; DIELECTRIC MATERIALS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC POTENTIAL; FAILURE ANALYSIS; GOLD; INTERFACES (MATERIALS);

DISPLACEMENT CURRENT MESUREMENT (DCM); INSULATOR INTERFACES;

FIELD EFFECT TRANSISTORS;

EID: 0348219362     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/jjap.42.l1275     Document Type: Article

References (8)

1. F. Ebisawa, T. Kurokawa and S. Nara: J. Appl. Phys. 54 (1983) 3255.
2. K. Kudo, M. Yamashita and T. Moriizumi: Jpn. J. Appl. Phys. 23 (1984) 130.
3. A. Tsumura, H. Koezuka and T. Ando: Appl. Phys. Lett. 49 (1986) 1210.
4. As a review article, e.g., C. D. Dimitrakopoulos and P. R. L. Malenfant: Adv. Mater. 14 (2002) 99.
5. S. M. Sze: Semiconductor Devices Physics and Technology (Wiley-VCH, New Jersey, 1985).
6. S. Egusa, N. Gemma, A. Miura K. Mizushima and M. Azuma: J. Appl. Phys. 71 (1992) 2042.
7. S. Egusa, A. Miura, N. Gemma, A. Miura and M. Azuma: Jpn. J. Appl. Phys. 33 (1994) 2741.
8. T. Arai, Y. Murakami, H. Suematsu, K. Kikuchi, Y. Achiba and I. Ikemoto: Solid State Commun. 84 (1992) 827.