Threshold voltage shift and formation of charge traps induced by light irradiation during the fabrication of organic light-emitting diodes

Applied Physics Letters

Volumn 92, Issue 20, 2008, Pages

  Noguchi, Yutaka ^a   Sato, Naoki ^a   Tanaka, Yuya ^a   Nakayama, Yasuo ^a   Ishii, Hisao ^a  

^a CHIBA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE DENSITY; CHARGE TRAPPING; ELECTRIC CURRENT MEASUREMENT; ELECTRIC DIPOLE MOMENTS; HOLE MOBILITY; THRESHOLD VOLTAGE;

HOLE INJECTION; LIGHT IRRADIATION; THRESHOLD VOLTAGE SHIFT;

ORGANIC LIGHT EMITTING DIODES (OLED);

EID: 44349098078     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2936084     Document Type: Article

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