Evidence of trigonal dangling bonds at the Ge(111)/oxide interface by electrically detected magnetic resonance

Physical Review Letters

Volumn 110, Issue 20, 2013, Pages

  Paleari, S ^a   Baldovino, S ^b   Molle, A ^b   Fanciulli, M ^a  

^a UNIVERSITY OF MILANO BICOCCA   (Italy)

^b LABORATORIO MDM   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

CONTACT LESS; ELECTRICALLY DETECTED MAGNETIC RESONANCES; ELECTRONIC APPLICATION; EVIDENCE-BASED; GE(111); POINT SYMMETRY; SI (1 1 1);

DANGLING BONDS; ELECTRONIC PROPERTIES; MAGNETIC RESONANCE; MAGNETIC RESONANCE SPECTROSCOPY; SILICON;

GERMANIUM;

EID: 84877912644     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.110.206101     Document Type: Article

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