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Volumn 96, Issue 22, 2010, Pages

Influence of the oxidizing species on the Ge dangling bonds at the (100) Ge/ GeO2 interface

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC OXYGEN; DEFECT MICROSTRUCTURE; ELECTRICAL RESPONSE; ELECTRICALLY DETECTED MAGNETIC RESONANCES; METAL OXIDE SEMICONDUCTOR STRUCTURES; OXIDATION MECHANISMS; OXIDIZING SPECIES;

EID: 77953582605     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3446839     Document Type: Article
Times cited : (32)

References (17)
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    • Zandvliet, H.J.W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.