Electron spin resonance features of interface defects in thermal (100) Si/SiO2

Journal of Applied Physics

Volumn 83, Issue 5, 1998, Pages 2449-2457

  Stesmans, A ^a   Afanas'ev, V V ^a  

^a UNIVERSITY OF LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000754322     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.367005     Document Type: Article

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