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Volumn 106, Issue 19, 2011, Pages

Electrically detected electron-spin-echo envelope modulation: A highly sensitive technique for resolving complex interface structures

(8) Hoehne, Felix a Lu, Jinming a Stegner, Andre R a Stutzmann, Martin a Brandt, Martin S a Rohrmüller, Martin b Schmidt, Wolf Gero b Gerstmann, Uwe b

a WALTER SCHOTTKY INSTITUT (Germany)

b UNIVERSITY OF PADERBORN (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO CALCULATIONS; COMPLEX INTERFACE; CRYSTALLINE SILICONS; ELECTRICAL DETECTION; ESEEM SPECTRA; HIGHLY SENSITIVE; HYPERFINE SPLITTINGS; INTERFACE DEFECTS; MICROSCOPIC MODELS; MODULATION PATTERNS; PHOSPHORUS-DOPED;

CALCULATIONS; DEFECTS; HIGH ENERGY PHYSICS; PHOSPHORUS;

MODULATION;

EID: 79960618784 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.106.196101 Document Type: Article

Times cited : (25)

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