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Thin Solid Films

Volumn 534, Issue , 2013, Pages 1-11

XPS for chemical- and charge-sensitive analyses

(2) Sezen, Hikmet a Suzer, Sefik a

a BILKENT UNIVERSITY (Turkey)

Author keywords

Band Bending; Charging; Electrets; p n Junction; Photoconductivity; Photovoltage; XPS

Indexed keywords

BANDBENDING; BINDING ENERGY SHIFTS; CHARGE ACCUMULATION; MATERIALS ANALYSIS; P-N JUNCTION; PHOTO-VOLTAGE; WIDE FREQUENCY RANGE; X-RAY PHOTOELECTRONS;

BINDING ENERGY; CHARGING (FURNACE); ELECTRETS; PHOTOCONDUCTIVITY; SEMICONDUCTOR JUNCTIONS; X RAY PHOTOELECTRON SPECTROSCOPY;

CHEMICAL ANALYSIS;

EID: 84876667828 PISSN: 00406090 EISSN: None Source Type: Journal
DOI: 10.1016/j.tsf.2013.02.002 Document Type: Review

Times cited : (49)

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