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Volumn 178-179, Issue C, 2010, Pages 373-379

Methods for probing charging properties of polymeric materials using XPS

Author keywords

Capacitance; Charging; Dielectric properties; Dynamics of charging; Polymeric matreials; Reseistance

Indexed keywords

ARTIFICIAL DIELECTRIC; ARTIFICIAL SYSTEMS; BLEND FILMS; CHARGING; CHARGING PROPERTY; ELECTRICAL CIRCUIT MODELS; EXPERIMENTAL DATA; FREQUENCY DEPENDENCE; HIGH FREQUENCY; LOW ENERGIES; POLYMERIC MATERIAL; SERIES CAPACITORS; SI WAFER; SQUARE-WAVE; X RAY PHOTOELECTRON SPECTRA; XPS; XPS SPECTRA;

EID: 77951023447     PISSN: 03682048     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.elspec.2009.04.003     Document Type: Article
Times cited : (13)

References (51)
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    • Tielsch, B.J.1    Fulgum, J.E.2
  • 38
    • 0004087505 scopus 로고    scopus 로고
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  • 50
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    • note
    • This term is borrowed from the electrochemistry literature and corresponds to the reduced electrochemical voltage (drop) as a result of the incurring current (V = I × R) change.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.