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Volumn 178-179, Issue C, 2010, Pages 373-379
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Methods for probing charging properties of polymeric materials using XPS
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Author keywords
Capacitance; Charging; Dielectric properties; Dynamics of charging; Polymeric matreials; Reseistance
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Indexed keywords
ARTIFICIAL DIELECTRIC;
ARTIFICIAL SYSTEMS;
BLEND FILMS;
CHARGING;
CHARGING PROPERTY;
ELECTRICAL CIRCUIT MODELS;
EXPERIMENTAL DATA;
FREQUENCY DEPENDENCE;
HIGH FREQUENCY;
LOW ENERGIES;
POLYMERIC MATERIAL;
SERIES CAPACITORS;
SI WAFER;
SQUARE-WAVE;
X RAY PHOTOELECTRON SPECTRA;
XPS;
XPS SPECTRA;
CAPACITANCE;
CAPACITORS;
DIELECTRIC MATERIALS;
DIELECTRIC PROPERTIES;
ESTERS;
MATERIALS PROPERTIES;
POLYSTYRENES;
RESISTORS;
SEMICONDUCTING SILICON COMPOUNDS;
SILICON WAFERS;
X RAY PHOTOELECTRON SPECTROSCOPY;
POLYMERS;
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EID: 77951023447
PISSN: 03682048
EISSN: None
Source Type: Journal
DOI: 10.1016/j.elspec.2009.04.003 Document Type: Article |
Times cited : (13)
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References (51)
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