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Analytical Methods

Volumn 4, Issue 11, 2012, Pages 3527-3530

XPS investigation of a Si-diode in operation

(1) Suzer, Sefik a

a BILKENT UNIVERSITY (Turkey)

Author keywords

[No Author keywords available]

Indexed keywords

APPLIED VOLTAGES; PEAK POSITION; POTENTIAL VARIATIONS; REVERSE BIAS;

PHOTOELECTRONS; SILICON; SURFACE POTENTIAL;

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 84868117007 PISSN: 17599660 EISSN: 17599679 Source Type: Journal
DOI: 10.1039/c2ay25901j Document Type: Article

Times cited : (12)

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