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Volumn 4, Issue 1, 2013, Pages 208-217

Photoresponse from single upright-standing ZnO nanorods explored by photoconductive AFM

Author keywords

AFM; Nanorods; Photoconductive AFM; Photoconductivity; ZnO

Indexed keywords

ATOMIC FORCE MICROSCOPY; DENSITY FUNCTIONAL THEORY; ELECTRONIC PROPERTIES; ENERGY GAP; II-VI SEMICONDUCTORS; NANORODS; OPTICAL PROPERTIES; OXYGEN; PHOTOCONDUCTIVITY; PHOTOCURRENTS; PHOTOLUMINESCENCE; SEMICONDUCTOR QUANTUM WELLS; ELECTRIC PROPERTIES; EXPERIMENTS;

EID: 84876114277     PISSN: None     EISSN: 21904286     Source Type: Journal    
DOI: 10.3762/bjnano.4.21     Document Type: Article
Times cited : (29)

References (56)
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    • Microcrystalline Silicon: Relation between Transport and Microstructure
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    • Kočka, J.; Stuchlíková, H.; Stuchlík, J.; Rezek, B.; Švrček, V.; Fojtík, P.; Pelant, I.; Fejfar, A. Microcrystalline Silicon: Relation between Transport and Microstructure. In Polycrystalline Semiconductors VI; Bonnaud, O.; Mohammed-Brahim, T.; Strunk, H. P.; Werner, J. H., Eds.; Solid State Phenomena; Trans Tech Publications Inc.: Durnten-Zurich, Switzerland, 2001; p 213.
    • (2001) Polycrystalline Semiconductors VI , pp. 213
    • Kočka, J.1    Stuchlíková, H.2    Stuchlík, J.3    Rezek, B.4    Švrček, V.5    Fojtík, P.6    Pelant, I.7    Fejfar, A.8
  • 28
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    • Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics
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    • Teichert, C.; Beinik, I. Conductive Atomic-Force Microscopy Investigation of Nanostructures in Microelectronics. In Scanning Probe Microscopy in Nanoscience and Nanotechnology 2; Bhushan, B., Ed.; Springer: Berlin Heidelberg, 2011; pp 691-721.
    • (2011) Scanning Probe Microscopy in Nanoscience and Nanotechnology , pp. 691-721
    • Teichert, C.1    Beinik, I.2
  • 45
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    • accessed Nov 6, 2012
    • http://www.nanosensors.com/ATEC-CONT.htm (accessed Nov 6, 2012).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.