Electrical properties of ZnO nanorods studied by conductive atomic force microscopy

Journal of Applied Physics

Volumn 110, Issue 5, 2011, Pages

  Beinik, I ^a   Kratzer, M ^a   Wachauer, A ^a   Wang, L ^a   Lechner, R T ^a   Teichert, C ^a   Motz, C ^b   Anwand, W ^c   Brauer, G ^c   Chen, X Y ^d   Hsu, X Y ^d   Djurisic A B ^d  

^a UNIVERSITY OF LEOBEN   (Austria)

^b ERICH SCHMID INSTITUTE OF MATERIALS SCIENCE   (Austria)

^c INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^d UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE ATOMIC FORCE MICROSCOPY; CONTACT-MODE AFM; CURRENT-VOLTAGE CHARACTERIZATION; ELECTRICAL AND OPTICAL PROPERTIES; ELECTRICAL CHARACTERIZATION; ELECTRONIC DEVICE; I - V CURVE; SCHOTTKY DIODES; SPECIFIC AREAS; ZNO; ZNO NANOROD; ZNO NANOSTRUCTURES;

ATOMIC FORCE MICROSCOPY; ELECTRIC PROPERTIES; NANORODS; OPTICAL PROPERTIES; SCHOTTKY BARRIER DIODES; ZINC OXIDE;

CURRENT VOLTAGE CHARACTERISTICS;

EID: 80052934399     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3623764     Document Type: Conference Paper

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