Local photoconductivity of microcrystalline silicon thin films measured by conductive atomic force microscopy

Physica Status Solidi - Rapid Research Letters

Volumn 5, Issue 10-11, 2011, Pages 373-375

  Ledinský, Martin ^a   Fejfar, Antonín ^a   Vetushka, Aliaksei ^a   Stuchlík, Jiří ^a   Rezek, Bohuslav ^a   Kočka, Jan ^a  

^a INSTITUTE OF PHYSICS   (Czech Republic)

Author keywords

Amorphous silicon; Atomic force microscopy; Nanocrystalline silicon; Photoconductivity; Thin films

Indexed keywords

AFM; AFM CANTILEVERS; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CURRENT FLOWS; DARK CONDITIONS; MICROCRYSTALLINE SILICON THIN FILMS; NANOCRYSTALLINES;

AMORPHOUS FILMS; ATOMIC FORCE MICROSCOPY; CONDUCTIVE FILMS; CURRENT VOLTAGE CHARACTERISTICS; MICROCRYSTALLINE SILICON; NANOCRYSTALLINE SILICON; PHOTOCONDUCTIVITY; PHOTOELECTRICITY; SEMICONDUCTING SILICON COMPOUNDS; THIN FILMS;

AMORPHOUS SILICON;

EID: 80155189605     PISSN: 18626254     EISSN: 18626270     Source Type: Journal    
DOI: 10.1002/pssr.201105413     Document Type: Article

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