Characterization of microstructural defects in melt grown ZnO single crystals

Journal of Applied Physics

Volumn 109, Issue 6, 2011, Pages

  Anwand, W ^a   Brauer, G ^a   Grynszpan, R I ^a   Cowan, T E ^a   Schulz, D ^b   Klimm, D ^b   Iek, J ^c   Kuriplach, J ^c   Prochzka, I ^c   Ling, C C ^d   Djurii, A B ^d   Klemm, V ^e   Schreiber, G ^e   Rafaja, D ^e  

^a INSTITUTE OF ION BEAM PHYSICS AND MATERIALS RESEARCH   (Germany)

^b Institut für Kristallzchtung   (Germany)

^c CHARLES UNIVERSITY   (Czech Republic)

^d UNIVERSITY OF HONG KONG   (Hong Kong)

^e TU BERGAKADEMIE FREIBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BLUE LIGHT; BOUND STATE; EDGE SHIFT; HIGH CONCENTRATION; HYDROTHERMALLY; MELT-GROWN; MICROSTRUCTURAL DEFECTS; MICROSTRUCTURE ANALYSIS; NUCLEAR REACTION ANALYSIS; OPTICAL ABSORPTION; OPTICAL TRANSMISSION MEASUREMENTS; POSITRON LIFETIME; POSITRON LIFETIME MEASUREMENTS; STRUCTURAL CHARACTERIZATION; ZINC INTERSTITIALS; ZNO; ZNO CRYSTALS; ZNO SINGLE CRYSTALS;

CHARACTERIZATION; CRYSTAL MICROSTRUCTURE; DEFECTS; ELECTRONS; HYDROGEN; LIGHT TRANSMISSION; POSITRON ANNIHILATION SPECTROSCOPY; POSITRONS; STACKING FAULTS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

SINGLE CRYSTALS;

EID: 79953672933     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3559264     Document Type: Article

References (51)

1. D. C. Look, J. Mater. Sci. Eng. 80, 383 (2001). 10.1016/S0921-5107(00) 00604-8 (Pubitemid 32331341)
2. . zgr, Y. I. Alivov, C. Lin, A. Teke, M. A. Reshchikov, S. Dogan, V. Avrutin, S.-J.-J. Cho and H. Morko, J. Appl. Phys. 98, 041301 (2005). 10.1063/1.1992666 (Pubitemid 41348664)
3. S. J. Pearton, D. P. Norton, K. Ip, Y. W. Heo, and T. Steiner, Prog. Mater. Sci. 50, 293 (2005). 10.1016/j.pmatsci.2004.04.001
4. S. Dutta, S. Chattopadhyay, A. Sarkar, M. Chakrabarti, D. Sanyal, and D. Jana, Prog. Mater. Sci. 54, 89 (2009). 10.1016/j.pmatsci.2008.07.002
5. Positron Spectroscopy of Solids, edited by, A. Dupasquier and, A. P. Mills, Jr, (IOS, Amsterdam, 1995).
6. R. Krause-Rehberg and H. S. Leipner, Positron Annihilation in Semiconductors-Defect Studies, (Springer, Berlin, 1999).
7. Slow Positron Beam Techniques for Solids and Surfaces, edited by, G. Brauer and, W. Anwand, (ELSEVIER, Amsterdam, 2002).
8. R. I. Grynszpan, W. Anwand, G. Brauer, and P. G. Coleman, Ann. Chim. (Paris) 32, 365 (2007).
9. G. Brauer, W. Anwand, D. Grambole, J. Grenzer, W. Skorupa, J. ek, J. Kuriplach, I. Prochzka, C. C. Ling, C. K. So, D. Schulz, and D. Klimm, Phys. Rev. B 79, 115212 (2009). 10.1103/PhysRevB.79.115212
10. D. Schulz, S. Ganschow, D. Klimm, M. Neubert, M. Roberg, M. Schmidbauer, and R. Fornani, J. Cryst. Growth 296, 27 (2006). 10.1016/j.jcrysgro.2006.08.012 (Pubitemid 44537280)
11. M. G. Wardle, J. P. Goss, and P. R. Briddon, Phys. Rev. Lett. 96, 205504 (2006). 10.1103/PhysRevLett.96.205504 (Pubitemid 43804572)
12. N. H. Nickel, Phys. Rev. B 73, 195204 (2006). 10.1103/PhysRevB.73.195204 (Pubitemid 43726722)
13. H. Takenaka and D. J. Singh, Phys. Rev. B 75, 241102(R) (2007). 10.1103/PhysRevB.75.241102
14. J. Cizek, N. Zaludova, M. Vlach, S. Danis, J. Kuriplach, I. Prochazka, G. Brauer, W. Anwand, D. Grambole, W. Skorupa, R. Gemma, R. Kirchheim, and A. Pundt, J. Appl. Phys. 103, 053508 (2008). 10.1063/1.2844479 (Pubitemid 351394073)
15. E. A. Lavrov, Physica B 404, 5075 (2009). 10.1016/j.physb.2009.08.250
16. E. V. Monakhov, A. Yu. Kuznetsov, and B. G. Svensson, J. Phys. D: Appl. Phys. 42, 153001 (2009). 10.1088/0022-3727/42/15/153001
17. W. Anwand, G. Brauer, T. E. Cowan, D. Grambole, H. Schmidt, W. Skorupa, J. Cizek, J. Kuriplach, I. Prochazka, W. Egger, and P. Sperr, Phys. Status Solidi. A 207, 2415 (2010). 10.1002/pssa.200925609
18. D. C. Reynolds, C. W. Litton, D. C. Look, J. E. Hoelscher, B. Claflin, T. C. Collins, J. Nause, and B. Nemeth, J. Appl. Phys. 95, 4802 (2004). 10.1063/1.1691186
19. J. Nause and B. Nemeth, Semicond. Sci. Technol. S 45 (2005).
20. W. A. Lanford, Nuclear Reactions for Hydrogen Analysis., in Handbook of Modern Ion Beam Materials Analysis, edited by, R. Tesmer and, M. Nastasi, (Materials Research Society, Pittsburgh, 1995) p. 193.
21. G. Brauer, W. Anwand, D. Grambole, W. Skorupa, Y. Hou, A. Andreev, C. Teichert, K. H. Tam, and A. B. Djurii, Nanotechnology 18, 195301 (2007). 10.1088/0957-4484/18/19/195301 (Pubitemid 46786434)
22. J. F. Ziegler, J. P. Biersack, and U. Littmark, The Stopping and Range of Ions in Solids (Pergamon, New York, 1985).
23. F. Bev, J. iek, L. Lestak, I. Novotny, I. Prochzka, and F. Sebesta, Nucl. Instrum. Methods Phys. Res. A 443, 557 (2000). 10.1016/S0168-9002(99)01156-0 (Pubitemid 30578600)
24. I. Prochzka, I. Novotny, and F. Bev, Mater. Sci. Forum 255-257, 772 (1997).
25. G. Brauer, W. Anwand, W. Skorupa, J. Kuriplach, O. Melikhova, J. iek, I. Prochzka, C. Moisson, H. von Wenckstern, H. Schmidt, M. Lorenz, and M. Grundmann, Superlattices Microstruct. 42, 259 (2007). 10.1016/j.spmi.2007.04.003 (Pubitemid 47381564)
26. E. H. Kisi and M. M. Elcombe, Acta Crystallogr. 45, 1867 (1989). 10.1107/S0108270189004269
27. G. Brauer, W. Anwand, W. Skorupa, J. Kuriplach, O. Melikhova, C. Moisson, H. von Wenckstern, H. Schmidt, M. Lorenz, and M. Grundmann, Phys. Rev. B 74, 045208 (2006). 10.1103/PhysRevB.74.045208 (Pubitemid 44088347)
28. G. Mie, Ann. Phys. 25, 377 (1908). 10.1002/andp.v330:3
29. P. W. Barber and S. S. Hill, Light Scattering by Particles: Computational Methods (World Scientific, Singapore, 1990).
30. J. Singleton, Band Theory and Electronic Properties of Solids., in Oxford Master Series in Condensed Matter Physics (Oxford University Press, Oxford, 2001).
31. M. D. Sturge, Phys. Rev. 127, 768 (1962);
32. 127, 768 (1962). 10.1103/PhysRev.127.768
33. X.-H. Li, J.-Y. Xu, M. Jin, H. Shen, and X.-M. Li, Chin. Phys. Lett. 23, 3356 (2006). 10.1088/0256-307X/23/12/065
34. A. Jain, P. Sagar, and R. M. Mehra, Solid-State Electron. 50, 1420 (2006). 10.1016/j.sse.2006.07.001 (Pubitemid 44232877)
35. C. Wang, Z. Chen, H. Hu, and D. Zhang, Physica B 404, 4075 (2009). 10.1016/j.physb.2009.07.165
36. Y. Chen, X. L. Xu, G. H. Zhang, H. Xue, and S. Y. Ma, Physica E 42, 1713 (2010). 10.1016/j.physe.2010.01.029
37. F. Yakuphanoglu, Y. Caglar, S. Ilican, and M. Caglar, Physica B 394, 86 (2007). 10.1016/j.physb.2007.02.014 (Pubitemid 46601819)
38. F. A. Selim, M. H. Weber, D. Solodovnikov, and K. G. Lynn, Phys. Rev. Lett. 99, 085502 (2007). 10.1103/PhysRevLett.99.085502 (Pubitemid 47311616)
39. L. E. Halliburton, N. C. Giles, N. Y. Garces, M. Luo, C. Xu, L. Bai, and L. A. Boatner, Appl. Phys. Lett. 87, 172108 (2005). 10.1063/1.2117630 (Pubitemid 41721885)
40. S. Lany and A. Zunger, Phys. Rev. B 78, 235104 (2008). 10.1103/PhysRevB.78.235104
41. A. Janotti and C. G. Van de Walle, Nature Mater. 6, 44 (2007). 10.1038/nmat1795 (Pubitemid 46041475)
42. A. F. Kohan, G. Ceder, D. Morgan, and C. G. Van de Walle, Phys. Rev. B 61, 15019 (2000). 10.1103/PhysRevB.61.15019
43. K. Irmscher, M. Albrecht, B. Heimbrodt, M. Naumann, T. Remmele, D. Schulz, T. Schulz, and R. Fornari, Phys. Status Solidi C 6, 2658 (2009). 10.1002/pssc.200982545
44. D. Gerthsen, D. Litvinov, Th. Gruber, C. Kirchner, and A. Waag, Appl. Phys. Lett. 81, 3972 (2002). 10.1063/1.1523151
45. A. Janotti and C. G. Van de Walle, Rep. Prog. Phys. 72, 126501 (2009). 10.1088/0034-4885/72/12/126501
46. E. V. Lavrov, F. Herklotz, and J. Weber, Phys. Rev. B 79, 165210 (2009). 10.1103/PhysRevB.79.165210
47. M. H. Weber, N. S. Parmar, K. A. Jones, and K. G. Lynn, J. Electro. Mater. 39, 573 (2010). 10.1007/s11664-010-1115-6
48. Y.-S.-S. Kim and C. H. Park, Phys. Rev. Lett. 102, 086403 (2009). 10.1103/PhysRevLett.102.086403
49. M. D. McCluskey and S. J. Jokela, J. Appl. Phys. 106, 071101 (2009). 10.1063/1.3216464
50. D. C. Look, G. C. Farlow, P. Reunchan, S. Limpijumnong, S. B. Zhang, and K. Nordlund, Phys. Rev. Lett. 95, 225502 (2005). 10.1103/PhysRevLett.95.225502 (Pubitemid 41776983)
51. B. E. Warren, X-ray Diffraction, (Dover Publishers, New York, 1990).