Nanostructure growth-induced defect formation and band bending at ZnO surfaces

Surface Science

Volumn 605, Issue 9-10, 2011, Pages

  Merz, T A ^a   Doutt, D R ^a   Bolton, T ^b   Dong, Y ^b   Brillson, L J ^a,b  

^a OHIO STATE UNIVERSITY   (United States)

^b Ohio State University   (United States)

Author keywords

Atomic force microscopy; Diffusion; Kelvin probe force microscopy; Nanostructure; Surface photovoltage spectroscopy; ZnO

Indexed keywords

BANDBENDING; DEEP LEVEL; GAP STATE; INDUCED DEFECTS; KELVIN PROBE FORCE MICROSCOPY; LOW-ACTIVATION ENERGY; NANO-SCALE SURFACES; NANOSTRUCTURE GROWTH; OPTICAL TECHNIQUE; POLAR SURFACES; SCHOTTKY BARRIERS; SPONTANEOUS GROWTH; SURFACE PHOTOVOLTAGE SPECTROSCOPY; ZNO; ZNO SURFACE;

ACTIVATION ENERGY; ATOMIC FORCE MICROSCOPY; DIFFUSION; NANOSTRUCTURES; OXYGEN; POINT DEFECTS; PROBES; SCHOTTKY BARRIER DIODES; SURFACE DEFECTS; SURFACE PROPERTIES; ZINC; ZINC OXIDE;

ATOMIC SPECTROSCOPY;

EID: 79953279775     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2010.12.021     Document Type: Article

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